Main Parameter:Non-contact Optical Thickness Measurement Instrument Used for measuring optical lense,silicon wafer surface,coating,eletronics central control chip etc.
Non-contact Optical VMM Vision Measuring Machine
High resolution VMM auto focus indentation measurement machine
Non-contact Optical Thickness Measurement Instrument
Used for measuring optical lense,silicon wafer surface,coating,eletronics central control chip etc.
Measuring Functions
Size:?Including horizontal distance, vertical distance, linear distance, radius, diameter
Angle:?contains horizontal angle, vertical angle, angle angle
Auxiliary generation:?Including auxiliary points, auxiliary lines, auxiliary round roughness analysis: Ra，Rq，Rz（Ry），Rz（DIN），R3z，Rz（jis），Rp，Rv，Rt，Rsk，Rsm，Rc?，Rpm，Rku，Rdq，Roc，Mr1，Mr2，Rpk，Rvk，Rk，Rdc，A1，A2，R，Rx，AR，Rcp，Rmax，Rz-ISO
Waviness analysis：wt，wa，wp，wv，wq，wc，wku，wsk，w，wx，wz，wsm，wdc，wte，wmr，Aw，c（wmr）wmr（c），wdq
Techinical Highlights
● Realize the correction function of different phase position positions, the measurement result is not affected by the misalignment of the workpiece, and the position deviation caused by the tilt
● Equipped with shape treatment algorithm filter, to maximize the effect of beating caused by interference
● Ultra -high sensitivity and large -scale dynamic light sensing elements can measure different reflexives workpieces, not affected by the color of the workpiece
● Diverse reflexes, man -reflexes, interference light and bruises
Product Parameters
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Item/Model | MMD-CON100F | |
Measuring range | X axis ? | 100mm |
Y axis | ±20mm | |
Z axis(contour) | Measuring distance: 4mm | |
Working distance: 10mm | ||
Z axis(roughness) | Measuring ? distance: 0.4mm | |
Working ? distance: 5mm | ||
Max measuring distance | 200mm | |
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Address:Tianhui Science Park, Industrial Second Road, Aerospace Base, Chang'an District, Xi'an City
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?+86 13087559846
Email：philipwang302@http://www.hhwjjxshh.cn
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